i4AI Ltd

Industry 4.0 Artificial Intelligence – Innovation and Invention Through Machine Intelligence

Publications

  • J. Liao, C. Cao and Y. Li, “Kolmogorov–Arnold Network-Based Adaptive Control Allocation for Overactuated Systems with Lyapunov-stable Learning,” Engineering Applications of Artificial Intelligence, 2026.
  • S. He, X. Wang, S. Yu and Y. Li, “LLM-Driven Framework for Industrial Design Automation,” Engineering, 2026.
  • F.Tian, X. Zhang and Y. Li, “Utility Estimation and Quality Evaluation Incentive Mechanism for Federated Learning,” IEEE Transactions on Cloud Computing, 2026.
  • J. Li, S. He, A. Li, S. Yu and Yun Li, “Multitask Evolution with Problem Reformulation for Global Exploration in Analog Circuit Design,” Advanced Engineering Informatics, 2026.
  • Y. Yan, S. Wang, J Xiao, H. Deng, C. Ma, J. Zhao and Y. Li, “Multiscale Physics-Embedded Automated Modeling with an Application to Photovoltaic Forecasting,” IEEE Transactions on Industrial Informatics, 2026.
  • B. Cao, X. Luo, X. Liu and Y. Li, “Comprehensive-Forecast Multiobjective Genetic Programming for Neural Architecture Search,” IEEE Transactions on Evolutionary Computation, 2026.
  • J. Liao, J. Xu, Y. Sun, M. Tang, S. He, J. Liao, S. Yu, Y. Li and X. Guan, “Automated CAD Modeling Sequence Generation from Text Descriptions via Transformer-Based Large Language Models,” ACL 2025 (Long Paper).
  • J. Liao, J. Xu, S. He, Z. Chen, S. Yu and Y. Li, “Autoforma: A large language model-based multi-agent for computer-automated design,” in IEEE International Conference on Systems, Man, and Cybernetics (SMC), 2024.
  • F. Sun, Y. Ke, Y.-J. Gong and Y. Li, “Transforming GP-CNN Tree Search Into Trainable Architectures for Image Classification,” in IEEE International Conference on Systems, Man, and Cybernetics (SMC), 2024.
  • S. Yu, Y. Ren, X. Wu, P. Guo and Y. Li, “Dynamic pruning-based Bayesian support vector regression for reliability analysis,” Reliability Engineering & System Safety, 244, 109922, 2024.
  • J. Li, Y. Zeng, H. Zhi, J. Yang, W. Shan and Y. Li, “Knowledge Transfer Framework for PVT Robustness in Analog Integrated Circuits,” IEEE Transactions on Circuits and Systems I, 2023.
  • J. Li, H. Zhi, W. Shan, Y. Li, “Multi-Task Evolutionary to PVT Knowledge Transfer for Analog Integrated Circuit Optimization,” in IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2023.
  • Y. Li, “What should “industry 4.0” differ from previous industrial revolutions?,” in 27th International Conference on Automation and Computing (ICAC), 2022.